This part of ISO 7637 establishes a bench top test for the evaluation of the immunity of devices under test (DUTs) to transient transmission by coupling via lines other than supply lines. The test transient pulses simulate both fast and slow transient disturbances, such as those caused by the switching of inductive loads and relay contact bounce. Three test methods are described in this part of ISO 7637: - the capacitive coupling clamp (CCC) method; - the direct capacitive coupling (DCC) method; and - the inductive coupling clamp (ICC) method.