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Standard IEC standard · IEC 60444-8:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

Status: Withdrawn

· Replaced by: IEC 60444-8:2016
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Standard IEC standard · IEC 60444-8:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
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Scope
Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.

Subjects

Piezoelectric devices (31.140)

Buy this standard

Standard IEC standard · IEC 60444-8:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 520 SEK
standard ikon pdf

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Price: 520 SEK
standard ikon

Paper

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Product information

Language: English

Written by: IEC

International title:

Article no: STD-563877

Edition: 1

Approved: 7/4/2003

No of pages: 11

Replaces: IEC PAS 62277:2001

Replaced by: IEC 60444-8:2016