Standard IEC standard · IEC 62276:2012

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Status: Upphävd

· Ersätts av: IEC 62276:2016
Köp denna standard

Standard IEC standard · IEC 62276:2012

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Prenumerera på standarden - Läs mer Dölj
Pris: 3 835 SEK
standard ikon pdf

PDF

Pris: 3 835 SEK
standard ikon

Papper

Fler alternativ Färre alternativ
Omfattning
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - "reduced LN" is appended to terms and definitions; - "reduced LT" is appended to terms and definitions; - reduction process is appended to terms and definitions.

Ämnesområden

Piezoelektriska komponenter (31.140)


Köp denna standard

Standard IEC standard · IEC 62276:2012

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Prenumerera på standarden - Läs mer Dölj
Pris: 3 835 SEK
standard ikon pdf

PDF

Pris: 3 835 SEK
standard ikon

Papper

Fler alternativ Färre alternativ

Produktinformation

Språk: Engelska Franska

Framtagen av: IEC

Internationell titel: Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Artikelnummer: STD-571599

Utgåva: 2

Fastställd: 2012-10-19

Antal sidor: 82

Ersätter: IEC PAS 62276:2001 , IEC 62276:2005

Ersätts av: IEC 62276:2016