Standard IEC standard · IEC 62276:2012

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Status: Withdrawn

· Replaced by: IEC 62276:2016
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Standard IEC standard · IEC 62276:2012

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
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Scope
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - "reduced LN" is appended to terms and definitions; - "reduced LT" is appended to terms and definitions; - reduction process is appended to terms and definitions.

Subjects

Piezoelectric devices (31.140)


Buy this standard

Standard IEC standard · IEC 62276:2012

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Subscribe on standards - Read more Dölj
Price: 3 835 SEK
standard ikon pdf

PDF

Price: 3 835 SEK
standard ikon

Paper

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Product information

Language: English French

Written by: IEC

International title:

Article no: STD-571599

Edition: 2

Approved: 10/19/2012

No of pages: 82

Replaces: IEC PAS 62276:2001 , IEC 62276:2005

Replaced by: IEC 62276:2016