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Standard IEC standard · IEC PAS 62276:2001

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

Status: Withdrawn

· Replaced by: IEC 62276:2012
Scope
Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and

Subjects

Piezoelectric devices (31.140)