Standard IEC standard · IEC 62276:2005

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Status: Withdrawn

· Replaced by: IEC 62276:2012
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Standard IEC standard · IEC 62276:2005

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
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Scope
Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filt

Subjects

Piezoelectric devices (31.140)


Buy this standard

Standard IEC standard · IEC 62276:2005

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Subscribe on standards - Read more Dölj
Price: 1 495 SEK
standard ikon pdf

PDF

Price: 1 495 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English

Written by: IEC

International title:

Article no: STD-567338

Edition: 1

Approved: 5/30/2005

No of pages: 34

Replaced by: IEC 62276:2012