Standard ASTM standard · ASTM F76

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

Status: Withdrawn

· Replaced by: ASTM F76
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Standard ASTM standard · ASTM F76

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
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Scope
1.1 These test methods cover two procedures for measuring the resistivity and Hall coefficient of single-crystal semiconductor specimens. These test methods differ most substantially in their test specimen requirements.1.1.1 Test Method A, va

Subjects

Electronics; Declarable Substances in Materials; 3D Imaging Systems (ASTM VOL 10.04) (98.010.04)


Buy this standard

Standard ASTM standard · ASTM F76

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Subscribe on standards - Read more Dölj
Price: 870 SEK
standard ikon pdf

PDF

Price: 870 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English

Written by: ASTM

International title:

Article no: STD-56445

Edition: 86

Approved: 10/31/1986

No of pages: 13

Replaced by: ASTM F76