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Standard Swedish standard · SS-EN 62374-1

Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Status: Valid

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Standard Swedish standard · SS-EN 62374-1

Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
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Subjects

General (31.080.01) Diodes (31.080.10) Thyristors (31.080.20) Transistors (31.080.30) Other (31.080.99)

Buy this standard

Standard Swedish standard · SS-EN 62374-1

Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 191 SEK
standard ikon pdf

PDF

Price: 191 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English

Written by: SEK SVENSK ELSTANDARD

International title:

Article no: STD-3335587

Edition: 1

Approved: 3/15/2013

No of pages: 16