Standard Swedish standard · SS-EN 62374-1

Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Status: Valid

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Standard Swedish standard · SS-EN 62374-1

Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
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Subjects

General (31.080.01) Diodes (31.080.10) Thyristors (31.080.20) Transistors (31.080.30) Other (31.080.99)


Buy this standard

Standard Swedish standard · SS-EN 62374-1

Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Subscribe on standards - Read more Dölj
Price: 191 SEK
standard ikon pdf

PDF

Price: 191 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English

Written by: SEK SVENSK ELSTANDARD

International title:

Article no: STD-3335587

Edition: 1

Approved: 3/15/2013

No of pages: 16