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Standard IEC standard · IEC 61000-4-20:2003/AMD1:2006

Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Status: Withdrawn

· Replaced by: IEC 61000-4-20:2010
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Standard IEC standard · IEC 61000-4-20:2003/AMD1:2006

Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
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Subjects

Emission (33.100.10) Immunity (33.100.20)

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Standard IEC standard · IEC 61000-4-20:2003/AMD1:2006

Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 250 SEK
standard ikon pdf

PDF

Price: 250 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English French

Written by: IEC

International title:

Article no: STD-568376

Edition: 1

Approved: 11/15/2006

No of pages: 7

Amendment: IEC 61000-4-20:2003

Replaced by: IEC 61000-4-20:2010