Standard Technical specification · SIS-ISO/TS 10867:2013

Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy (ISO/TS 10867:2010, IDT)

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Standard Technical specification · SIS-ISO/TS 10867:2013

Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy (ISO/TS 10867:2010, IDT)
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Scope
This Technical Specification provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. This Technical Specification provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities. The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.

Subjects

Physics, chemistry (07.030)


Buy this standard

Standard Technical specification · SIS-ISO/TS 10867:2013

Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy (ISO/TS 10867:2010, IDT)
Subscribe on standards - Read more Dölj
Price: 755 SEK
standard ikon pdf

PDF

Price: 755 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English

Written by: SIS - Materialteknik

International title:

Article no: STD-89950

Edition: 1

Approved: 5/3/2013

No of pages: 28