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Standard ASTM standard · ASTM F1192

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

Status: Withdrawn

· Replaced by: ASTM F1192
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Standard ASTM standard · ASTM F1192

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
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Scope
1.1 This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an atomic number Z 2. This description specif

Subjects

Electronics; Declarable Substances in Materials; 3D Imaging Systems (ASTM VOL 10.04) (98.010.04)

Buy this standard

Standard ASTM standard · ASTM F1192

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 870 SEK
standard ikon pdf

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Product information

Language: English

Written by: ASTM

International title:

Article no: STD-55360

Edition: 2000

Approved: 7/1/2006

No of pages: 11

Replaced by: ASTM F1192