295 träffar på

IEC/PAS 62175
Standard · IEC standard IEC/PAS 62175

Marking permanency test method

-

Språk

Publicerad

2000-08-24
IEC/PAS 62177
Standard · IEC standard IEC/PAS 62177

Highly-accelerated temperature and humidity stress test (HAST)

-

Språk

Publicerad

2000-08-24

Upphävd

2002-04-12
PDF · 315 SEK
IEC/PAS 62178
Standard · IEC standard IEC/PAS 62178

Temperature cycling

-

Språk

Publicerad

2000-08-22

Upphävd

2003-07-11
PDF · 315 SEK
IEC/PAS 62179
Standard · IEC standard IEC/PAS 62179

Electrostatic discharge (ESD) sensitivity testing human body model (HBM)

-

Språk

Publicerad

2000-08-22

Upphävd

2003-10-21
IEC/PAS 62180
Standard · IEC standard IEC/PAS 62180

Electrostatic discharge (ESD) sensitivity testing machine model (MM)

-

Språk

Publicerad

2000-08-22

Upphävd

2003-10-21
IEC/PAS 62182
Standard · IEC standard IEC/PAS 62182

Preconditioning of nonhermetic surface mount devices prior to reliability testing

-

Språk

Publicerad

2000-09-14

Upphävd

2005-01-20
IEC/PAS 62183
Standard · IEC standard IEC/PAS 62183

øSalt atmosphere Salt atmosphere

-

Språk

Publicerad

2000-08-24

Upphävd

2002-04-12
PDF · 315 SEK
IEC/PAS 62184
Standard · IEC standard IEC/PAS 62184

Lead integrity test method

-

Språk

Publicerad

2000-08-22

Upphävd

2003-08-07
IEC/PAS 62185
Standard · IEC standard IEC/PAS 62185

Thermal shock test method

-

Språk

Publicerad

2000-08-22

Upphävd

2002-04-12
PDF · 315 SEK
IEC/PAS 62186
Standard · IEC standard IEC/PAS 62186

Mechanical shock test method

-

Språk

Publicerad

2000-08-24

Upphävd

2002-04-12
PDF · 315 SEK
IEC/PAS 62187
Standard · IEC standard IEC/PAS 62187

Variable frequency vibration test method

-

Språk

Publicerad

2000-08-24
IEC/PAS 62189
Standard · IEC standard IEC/PAS 62189

Bias Life

-

Språk

Publicerad

2000-11-28

Upphävd

2004-02-23
IEC/PAS 62190
Standard · IEC standard IEC/PAS 62190

Moisture/reflow sensivity classification for nonhermetic solid state surface mount devices

-

Språk

Publicerad

2000-11-28
IEC/PAS 62191
Standard · IEC standard IEC/PAS 62191

Acoustic microscopy for nonhermetic encapsulated electronic components

-

Språk

Publicerad

2000-11-28
IEC/PAS 62201
Standard · IEC standard IEC/PAS 62201

A procedure for executing SWEAT

-

Språk

Publicerad

2000-11-28

Upphävd

2004-05-01
IEC/PAS 62207
Standard · IEC standard IEC/PAS 62207

Hermeticity

-

Språk

Publicerad

2000-11-28
IEC 60191-6-5
Standard · IEC standard IEC 60191-6-5

Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-5: Règles générales pour la préparation des dessins d'encombrement des disposi...

Provides common outline drawings and dimensions for all types of structures and composed materials of fine-pitch ball grid array the terminal pitch of which is less than or equal to 0,80 mm.

Språk

Publicerad

2001-08-27
PDF · 315 SEK
IEC 60191-6-8
Standard · IEC standard IEC 60191-6-8

Normalisation mécanique des dispositifs à semiconducteurs - Patie 6-8: Règles générales pour la préparation des dessins d'encombrement des disposit...

Provides the common outline drawings and dimensions for all types of structures and composed material of glass sealed ceramic quad flatpack.

Språk

Publicerad

2001-08-27
PDF · 315 SEK
IEC/PAS 61156-5
Standard · IEC standard IEC/PAS 61156-5

Symmetrical pair/quad cables for digital communications with transmission characteristics up to 600 MHz - Horizontal floor wiring - Sectional speci...

-

Språk

Publicerad

2001-08-28
IEC 60191-6-1
Standard · IEC standard IEC 60191-6-1

Normalisation mécanique des dispositifs à semi-conducteurs - Partie 6-1: Règles générales pour la préparation des dessins d'encombrement des dispos...

Covers the requirements for the design rule of terminal shape plastic packages with gull-wing leads (e.g. QFP, SOP, SSOP, TSOP, etc.)

Språk

Publicerad

2001-10-30
PDF · 315 SEK
IEC 60749 am2
Standard · IEC standard IEC 60749 am2

Amendement 2

-

Språk

Publicerad

2001-10-17

Upphävd

2004-01-01
PDF · 1.330 SEK
IEC 60749
Standard · IEC standard IEC 60749

Dispositifs à semiconducteurs - Essais mécaniques et climatiques

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred value...

Språk

Publicerad

2002-04-10

Upphävd

2004-01-01
PDF · 2.030 SEK
IEC 60749-2
Standard · IEC standard IEC 60749-2

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 2: Basse pression atmosphérique

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to ...

Språk

Publicerad

2002-04-12
PDF · 315 SEK
IEC 60749-3
Standard · IEC standard IEC 60749-3

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 3 : Examen visuel externe

Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspectio...

Språk

Publicerad

2002-04-09
PDF · 315 SEK
IEC 60749-4
Standard · IEC standard IEC 60749-4

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 4: Essai continu fortement accéléré de contrainte de chaleur h...

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Språk

Publicerad

2002-04-12
PDF · 315 SEK
IEC 60749-6
Standard · IEC standard IEC 60749-6

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 6: Stockage à haute température

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

Språk

Publicerad

2002-04-12
PDF · 315 SEK
IEC 60749-9
Standard · IEC standard IEC 60749-9

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 9: Permanence du marquage

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux re...

Språk

Publicerad

2002-04-12
PDF · 315 SEK
IEC 60749-10
Standard · IEC standard IEC 60749-10

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 10: Chocs mécaniques

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied fo...

Språk

Publicerad

2002-04-09
PDF · 315 SEK
IEC 60749-11
Standard · IEC standard IEC 60749-11

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 11: Variations rapides de température - Méthode des deux bains

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that ...

Språk

Publicerad

2002-04-12
PDF · 315 SEK
IEC 60749-13
Standard · IEC standard IEC 60749-13

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13 : Atmosphère saline

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exp...

Språk

Publicerad

2002-04-12
PDF · 315 SEK
Förfina din sökning genom att visa:
...som handlar om:

Ämnesområden (0)

Avbryt

Branscher (0)

Avbryt

Syfte (0)

Avbryt

Material (0)

Avbryt
Visa varukorgen Fortsätt handla 0
Varukorgen Stäng
Annonstext