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SS-EN 61988-3-1
Standard · Ikraftsättning, endast offentliggörande SS-EN 61988-3-1

Plasmapaneler - Del 3-1: Mekaniskt gränssnitt

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Språk

Publicerad

2006-09-04
PDF · 0 SEK
SS-EN 61076-1
Standard · Ikraftsättning, endast offentliggörande SS-EN 61076-1

Anslutningsdon för elektronikutrustning - Del 1: Artspecifikation

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Språk

Publicerad

2006-09-04
PDF · 0 SEK
SS-EN 61076-2-101 A 1
Standard · Ikraftsättning, endast offentliggörande SS-EN 61076-2-101 A 1

Anslutningsdon för elektronikutrustning - Del 2-101: Runda anslutningsdon - Detaljspecifikation för anslutningsdon M8 med skruvfattning eller snäpp...

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Språk

Publicerad

2006-09-04

Upphävd

2011-08-01
PDF · 0 SEK
SS-EN 60512-1-100
Standard · Ikraftsättning, endast offentliggörande SS-EN 60512-1-100

Anslutningsdon för elektronikutrustning - Provning och mätning - Del 1-100:Tillämpliga publikationer

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Språk

Publicerad

2006-09-04
PDF · 0 SEK
IEC 60191-2 Amd 13
Standard · IEC standard IEC 60191-2 Amd 13

Amendement 13 - Normalisation mécanique des dispositifs à semiconducteurs - Partie 2: Dimensions

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Språk

Publicerad

2006-08-09
PDF · 490 SEK
IEC 60191-2 Amd 14
Standard · IEC standard IEC 60191-2 Amd 14

Amendement 14 - Normalisation mécanique des dispositifs à semiconducteurs - Partie 2: Dimensions

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Språk

Publicerad

2006-08-09
PDF · 315 SEK
IEC 60068-2-21
Standard · IEC standard IEC 60068-2-21

Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices

Applicable to all electrical and electronic components whose terminations or integral mounting devices are liable to be submitted to stresses during normal assembly or handling operations.

Språk

Publicerad

2006-08-09
PDF · 420 SEK
IEC 60384-24
Standard · IEC standard IEC 60384-24

Fixed capacitors for use in electronic equipment - Part 24: Sectional specification - Surface mount fixed tantalum electrolytic capacitors with con...

is applicable to tantalum electrolytic capacitors with conductive polymer solid electrolyte. These capacitors are primarily intended to be mounted direct on to substrates for hybrid circuits or to ...

Språk

Publicerad

2006-08-09
PDF · 350 SEK
IEC 60384-24-1
Standard · IEC standard IEC 60384-24-1

Fixed capacitors for use in electronic equipment - Part 24-1: Blank detail specification - Surface mount fixed tantalum electrolytic capacitors wit...

is a supplementary document to the sectional specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with thes...

Språk

Publicerad

2006-08-09
PDF · 315 SEK
IEC 60384-25
Standard · IEC standard IEC 60384-25

Fixed capacitors for use in electronic equipment - Part 25: Sectional specification - Surface mount fixed aluminium electrolytic capacitors with co...

is applicable to aluminium electrolytic capacitors with conductive polymer solid electrolyte. These capacitors are primarily intended to be mounted direct on substrates for hybrid circuits or to pr...

Språk

Publicerad

2006-08-09
PDF · 420 SEK
IEC 60384-25-1
Standard · IEC standard IEC 60384-25-1

Fixed capacitors for use in electronic equipment - Part 25-1: Blank detail specification - Surface mount fixed aluminum electrolytic capacitors wit...

is a supplementary document to the sectional specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with thes...

Språk

Publicerad

2006-08-09
PDF · 315 SEK
IEC 60191-2 Amd 15
Standard · IEC standard IEC 60191-2 Amd 15

Amendement 15 - Normalisation mécanique des dispositifs à semiconducteurs - Partie 2: Dimensions

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Språk

Publicerad

2006-08-09
PDF · 315 SEK
IEC 60749-27
Standard · IEC standard IEC 60749-27

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 27: Essai de sensibilité aux décharges électrostatiques (DES) ...

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostat...

Språk

Publicerad

2006-08-09
PDF · 665 SEK
IEC 60749-35
Standard · IEC standard IEC 60749-35

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 35: Microscopie acoustique pour composants électroniques à boî...

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cr...

Språk

Publicerad

2006-08-09
PDF · 910 SEK
IEC 60749-39
Standard · IEC standard IEC 60749-39

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 39: Mesure de la diffusion d'humidité et de l'hydrosolubilité ...

Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. Th...

Språk

Publicerad

2006-08-09
PDF · 315 SEK
IEC 61076-3-104
Standard · IEC standard IEC 61076-3-104

Connectors for electronic equipment - Product requirements - Part 3-104: Detail specification for 8-way, shielded free and fixed connectors for dat...

Establishes uniform specifications, type testing requirements and quality assessment procedures for 8-way, shielded free and fixed connectors for data transmissions with frequencies up to 1 000 MHz...

Språk

Publicerad

2006-08-09
PDF · 1.610 SEK
IEC 61189-6
Standard · IEC standard IEC 61189-6

Test methods for electrical materials, interconnection structures and assemblies - Part 6: Test methods for materials used in manufacturing electro...

Provides a catalogue of test methods representing methodologies andprocedures that can be applied to materials used in manufacturing electronic assemblies.

Språk

Publicerad

2006-08-09
PDF · 910 SEK
IEC/TR 61352
Standard · IEC standard IEC/TR 61352

Mnémoniques et symboles pour circuits intégrés

Gives recommendations, mainly to designers and manufacturers of integrated circuits, in order to arrive at symbols for devices with a consistent use of mnemonics and qualifying symbols. Is intended...

Språk

Publicerad

2006-08-09
PDF · 1.050 SEK
IEC 61967-4
Standard · IEC standard IEC 61967-4

Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz - Partie 4: Mesure des émissions conduites - Méthode par couplage dire...

Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage meas...

Språk

Publicerad

2006-08-09
PDF · 1.330 SEK
IEC 62373
Standard · IEC standard IEC 62373

Essai de stabilité de température en polarisation pour transistors à effet de champ métal-oxyde-semiconducteur (MOSFET)

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

Språk

Publicerad

2006-08-09
PDF · 420 SEK
IEC 60603-7-7
Standard · IEC standard IEC 60603-7-7

Connectors for electronic equipment - Part 7-7: Detail specification for 8-way, shielded, free and fixed connectors, for data transmissions with fr...

Covers 8 way connectors, up to 4 pairs, and specifies mechanical and environmental requirements, and electrical transmission requirements for frequencies up to 600 MHz. These connectors are typical...

Språk

Publicerad

2006-08-09

Upphävd

2010-05-31
PDF · 1.610 SEK
IEC 61587-3
Standard · IEC standard IEC 61587-3

Structures mécaniques pour équipement électronique - Essais pour la CEI 60917 et la CEI 60297 - Partie 3: Essais de performance du blindage électro...

Specifies the tests for empty cabinets and subracks concerning electromagnetic shielding performance, in the frequency range of 30 MHz to 2 000 MHz. Ensures physical integrity and environmental per...

Språk

Publicerad

2006-08-09

Upphävd

2013-02-06
PDF · 420 SEK
IEC 60749-26
Standard · IEC standard IEC 60749-26

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 26: Essai de sensibilité aux décharges électrostatiques (DES) ...

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electro...

Språk

Publicerad

2006-08-09

Upphävd

2013-04-23
PDF · 420 SEK
SS-EN ISO 13697:2006
Standard · Svensk standard SS-EN ISO 13697:2006

Lasrar och lasertillbehör - Provningsmetoder för speglande reflektansfaktor och transmittans av optiska laserkomponenter (ISO 13697:2006)

This International Standard specifies measurement procedures for the precise determination of the specular reflectance and regular transmittance of optical laser components. The accuracy of the des...

Språk

Publicerad

2006-08-07
PDF · 745 SEK
SS-EN ISO 14880-3:2006
Standard · Svensk standard SS-EN ISO 14880-3:2006

Optik och fotonik - Mikrolinsmatriser - Del 3: Provningsmetoder för optiska egenskaper andra än vågfrontsavvikelser (ISO 14880-3:2006)

This part of ISO 14880 specifies methods for testing optical properties, other than wavefront aberrations, of microlenses in microlens arrays. It is applicable to microlens arrays with very small l...

Språk

Publicerad

2006-08-07
PDF · 745 SEK
SS-EN ISO 14880-4:2006
Standard · Svensk standard SS-EN ISO 14880-4:2006

Optik och fotonik - Mikrolinsmatriser - Del 4: Provningsmetoder för geometriska egenskaper (ISO 14880-4:2006)

This part of ISO 14880 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more sur...

Språk

Publicerad

2006-08-07
PDF · 855 SEK
ISO 11554:2006
Standard · ISO standard ISO 11554:2006

Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics

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Språk

Publicerad

2006-06-09
ISO 11145:2006
Standard · ISO standard ISO 11145:2006

Optics and photonics - Lasers and laser-related equipment - Vocabulary and symbols

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Språk

Publicerad

2006-06-09
PDF · 1.039 SEK
ISO 13697:2006
Standard · ISO standard ISO 13697:2006

Optics and photonics - Lasers and laser-related equipment - Test methods for specular reflectance and regular transmittance of optical laser compon...

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Språk

Publicerad

2006-06-09
PDF · 733 SEK
ISO 14880-3:2006
Standard · ISO standard ISO 14880-3:2006

Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations

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Språk

Publicerad

2006-06-09
PDF · 730 SEK
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