1.1 This test method covers the measurement of MOSFET (Note 1) drain leakage current.Note 1—MOS is an acronym for metal-oxide semiconductor; FET is an acronym for field-effect transistor.1.2 This test method is applicable to all enh
ASTM
Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric) (Withdrawn 2009)
STD-49795
1996
1996-06-10
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