ASTM F1227

Test Method for Total Mass Loss of Materials and Condensation of Outgassed Volatiles on Microelectronics-Related Substrates (Withdrawn 2000)

Standard · ASTM
ASTM F1227

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1.1 This test method covers various thermoplastics and thermosets routinely used in the microelectronics industry. This test method covers a screening technique to determine volatile content of these materials when exposed to a vacuum environment. Two

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