Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Product information

Language

• English

Written by

SEK Svensk Elstandard

International title

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Article No.

STD-3331662

Edition

1

Approved

2004-06-28

Pages

0

Endorsment

• IEC 60749-34

Parallel edition

• SS-EN 60749-34

Subject

• Semiconductor devices in general
  31.080.01